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PROBION PROBION offers the highest integrity analysis of thin-film chemical composition to the European semiconductor and material industry. Our service is based on three principles: Reliability We use the most advanced SIMS technology that exists today. Our technical staff has extensive experience in the analysis of surface and thin film composition of silicon based structures as well as compound semiconductors. This experience was acquired at CNET/ France Telecom, with the Castaing-Slodzian group, who invented the instrument, and with CAMECA who developed it. Speed PROBION warranties analytical results within 5 business days. Analysis in less than 24 hours can be arranged by special request. Discretion Because the composition of your thin films is critical to your competitive edge, PROBION warranties to each customer complete security regarding the analysis of your materials. Please feel free to inquire about the details of this unique guarantee. PROBION is equipped with four Ion Mass Spectrometers from CAMECA. These instruments are extremely powerful and versatile: What can it do? It allows surface analysis and depth profiling in almost any solid material. It shows high sensitivity, an extreme dynamic concentration range, together with a high depth resolution and an ultimate mass separation capability. It is especially useful to measure trace elements undetected by other techniques. This is true for any element, including hydrogen. Secondary ion imaging provides high spatial resolution of a 2D elemental distribution. Our instruments are the only ones offering both imaging modes: ion microscope and ion microprobe. Technical staff:
Maurice Quillec
Didier Renard
Ting-Di Wu
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Worldwide except France and Japan |
