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Atomergic Chemetals now produce electronic 2" GaAs MLEC wafers with low EPD The new Modified Czochralski growth method (MLEC) for production of Gallium Arsenide Wafers offers electronic wafers which have lower Etch Pit Density levels (EPD) than traditional LEC growth. The manufacturing method is not Horizontal Bridgeman (HB) or Vertical Gradient Freeze (VGF).
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3 December 1999
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